MIL-DTL-81919C(AS)
(1) Step-by-step test access or item/circuit isolation procedure,
(2) Test result(s) to appropriate fault isolation procedure matrix table,
(3) Separate logic text format procedures,
(4) Additional entry point or separate logic tree troubleshooting diagram,
(5) Any combination of the above procedures.
e. Separate procedure usage. Separate fault isolation procedures shall be used when:
(1) Extensive pre-test setup and/or test access procedures are required.
(2) Lengthy step-by-step fault isolation procedures are required.
3.3.3.3 Common requirements.
a. SE and material required identification. "Support Equipment Required" and "Material
Required" lists shall be prepared in accordance with MIL-DTL-81927. Only approved SE
required for the maintenance level(s) covered, shall be listed or used in the procedures.
b. Step-by-step procedures. Step-by-step procedures, supported with appropriate
illustrations, shall be provided for all pre-test setup, testing, troubleshooting, and post-test
teardown procedures.
c. References. See MIL-DTL-81927.
d. Adjustment or alignment procedures. Adjustment/alignment procedures shall be
integrated into the testing (checkout) or troubleshooting (fault isolation) procedures at the
point of observation, if possible. When extensive access or different setup procedures are
required, the procedure(s) shall be referenced.
3.3.3.4 Manual test procedures.
a. Pre-test setup procedures. Pre-test setup procedures, including pre-test setup illustrations,
as required, e.g., test equipment interconnection diagram.
b. Testing and troubleshooting procedures. Testing and troubleshooting procedures may be
integrated into one procedure using "logic text format" or may be written as separate
procedures.
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